Influence of PVT Variation and Threshold Selection on OBT and OBIST Fault Detection in RFCMOS Amplifiers

Oscillation-based testing (OBT) and built-in self-testing (OBIST) circuits enable detection of catastrophic faults in analogue RF circuits, but both are sensitive to process, voltage temperature (PVT) variation. This paper investigates 15 OBT OBIST feature extraction strategies, four approaches threshold selection, by calculating figure-of-merit (FOM) across PVT is done using a 2.4 GHz LNA $0.35 \mu \mathrm{m}$ CMOS as DUT. Of the approaches, found more effective, with some benefit gained from switched-state detection. selection (nominal-ranged static thresholds, extreme-range dynamic simple noise-filtered tone detection), thresholds resulted highest average FoM 0.919, best 0.952, corresponding probability test escape notation="LaTeX">$P\left(T_E\right)$ yield loss notation="LaTeX">$P\left(Y_L\right)$ notation="LaTeX">$5 \cdot 10^{-2}$ notation="LaTeX">$1.89 respectively requires accurate measurement. Extreme comparable 0.912, less susceptibility process variation without need for Binary oscillating least complex approach, an 0.891.